The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Mar. 21, 2007
Cordt Erfling, Paderborn, DE;
Rainer Lübbers, Paderborn, DE;
Wilfried Rostek, Paderborn, DE;
Tim Finke, Bielefeld, DE;
Cordt Erfling, Paderborn, DE;
Rainer Lübbers, Paderborn, DE;
Wilfried Rostek, Paderborn, DE;
Tim Finke, Bielefeld, DE;
Benteler Automobiltechnik GmbH, Paderborn, DE;
Abstract
This present invention relates to an apparatus for measuring structural parts which includes a measuring system having at least two sensors for optoelectronic scanning of such a structural part wherein said part and said sensors are movable relatively to each other along a shifting path and wherein said sensors are provided with a radiation source directed to a surface of the structural part and with a receiver, characterized by the fact that at least one sensor is an area sensor adapted to scan one surface section of the structural part () in each measuring time interval and/or that at least one sensor is a line sensor adapted to detect one profile line of said structural part in each measuring interval.