The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Dec. 06, 2006
Donald Robert Howard, Troy, NY (US);
Harry Israel Ringermacher, Delanson, NY (US);
Marc Dubois, Keller, TX (US);
Timothy Gerard Richter, Wynantskill, NY (US);
Thomas E. Drake, Fort Worth, TX (US);
Donald Robert Howard, Troy, NY (US);
Harry Israel Ringermacher, Delanson, NY (US);
Marc Dubois, Keller, TX (US);
Timothy Gerard Richter, Wynantskill, NY (US);
Thomas E. Drake, Fort Worth, TX (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An inspection system is provided to examine internal structures of a target material. This inspection system combines an ultrasonic inspection system and a thermographic inspection system. The thermographic inspection system is attached to ultrasonic inspection and modified to enable thermographic inspection of target materials at distances compatible with laser ultrasonic inspection. Quantitative information is obtained using depth infrared (IR) imaging on the target material. The IR imaging and laser-ultrasound results are combined and projected on a 3D projection of complex shape composites. The thermographic results complement the laser-ultrasound results and yield information about the target material's internal structure that is more complete and more reliable, especially when the target materials are thin composite parts.