The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2009

Filed:

Jun. 09, 2008
Applicants:

Michael Asher, Conyers, GA (US);

Hossein Eslambolchi, Los Altos Hills, CA (US);

Chuck Giddens, Conyers, GA (US);

John Sinclair Huffman, Conyers, GA (US);

Harold Stewart, Alpharetta, GA (US);

Inventors:

Michael Asher, Conyers, GA (US);

Hossein Eslambolchi, Los Altos Hills, CA (US);

Chuck Giddens, Conyers, GA (US);

John Sinclair Huffman, Conyers, GA (US);

Harold Stewart, Alpharetta, GA (US);

Assignee:

AT&T Corp, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. The reference trace may be replaced or an alarm may be transmitted under certain conditions.


Find Patent Forward Citations

Quick Actions:

Asher, Michael. (2009). Application of statistical inference to optical time domain reflectometer data (U.S. Patent No. 7605912). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7605912

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