The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Oct. 10, 2007
Applicants:
Kelan Wieloch, Boothwyn, PA (US);
Robert K. Grygier, Newark, DE (US);
Inventors:
Kelan Wieloch, Boothwyn, PA (US);
Robert K. Grygier, Newark, DE (US);
Assignee:
Applied Extrusion Technologies, Inc., New Castle, DE (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus and method for characterizing perceived visual quality of holographic materials, such as diffraction gratings. A white light source directs a collimated beam onto an embossed material. The first order diffracted light strikes a white background directly in view of a digital camera, which records an image. The image is analyzed to calculate total color intensity of the diffracted light and an estimate of the color distinctness. The data is compared to other samples to determine relative visual quality.