The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2009

Filed:

Jul. 11, 2007
Applicant:

Kang Ho Ahn, Yongsan-Ku, Seoul, KR;

Inventor:

Kang Ho Ahn, Yongsan-Ku, Seoul, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particle measuring system and method is capable of separating particles on a size-by-size basis and measuring the number and size of the particles one by one on a real time basis. The particle measuring system includes a sampling device for guiding a stream of an aerosol containing particles suspended in a gas, an analysis device for separating one by one the particles contained in the aerosol, a filter for filtering out the particles contained in the aerosol to produce a filtered gas, a saturating device for saturating the filtered gas with working liquid to thereby produce a saturated gas, a condensing device for condensing the saturated gas to produce liquid droplets each having a nucleus formed of one of the particles, and an optical particle counter for calculating the number and size of the particles contained in the liquid droplets.


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