The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7605628 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 20, 2009

Filed:

May. 07, 2007
Applicants:

Terence J. Magee, San Francisco, CA (US);

Thomas Hughes, San Francisco, CA (US);

Hui-yin Seto, San Jose, CA (US);

Inventors:

Terence J. Magee, San Francisco, CA (US);

Thomas Hughes, San Francisco, CA (US);

Hui-Yin Seto, San Jose, CA (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for glitch-free updates of a standard cell-based programmable delay including the steps of (A) generating an output signal in response to an input signal and a plurality of first control signals and (B) generating the plurality of first control signals in response to the output signal and a plurality of second control signals. The output signal may include a delayed version of the input signal. An amount of delay between the input signal and the output signal may be determined based upon the plurality of first control signals.


Find Patent Forward Citations

Magee, Terence. (2009). System for glitch-free delay updates of a standard cell-based programmable delay (U.S. Patent No. 7605628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7605628

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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