The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7605436 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 20, 2009

Filed:

Jul. 03, 2008
Applicant:

Masaomi Yamaguchi, Kawasaki, JP;

Inventor:

Masaomi Yamaguchi, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method contains the steps of (a) heating a silicon substrate in a reaction chamber; and (b) supplying film-forming gas containing source gas, nitridizing gas, and nitridation enhancing gas to a surface of the heated silicon substrate, to deposit on the silicon substrate an HfAlO:N film (0.1<x<0.3) having a higher specific dielectric constant than that of silicon oxide, and incorporating N, by thermal CVD. The method can form an oxide film of HfAlO (0<x<0.3) having desired characteristics, as a gate insulation film.


Find Patent Forward Citations

Yamaguchi, Masaomi. (2009). Manufacture of semiconductor device having insulation film of high dielectric constant (U.S. Patent No. 7605436). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7605436

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