The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Jul. 18, 2002
Applicant:
Siliang Zhou, Hayward, CA (US);
Inventor:
Siliang Zhou, Hayward, CA (US);
Assignee:
Relia Diagnostic Systems LLC, San Francisco, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/06 (2006.01); G01N 33/53 (2006.01); G01N 33/566 (2006.01); G01N 33/543 (2006.01); G01N 21/77 (2006.01); G01N 1/18 (2006.01); B01L 3/02 (2006.01); C12Q 1/00 (2006.01); C12M 1/34 (2006.01); C12M 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test strip for conducting a lateral flow assay for detection of an analyte in a sample that contains cells and fluid is provided, as well as methods for making and using the test strip. This test strip is commercially usable, for example, in a diagnostic device at a point of care for detection of analytes in whole blood.
Quick Actions:
Zhou, Siliang. (2009). Test strip for a lateral flow assay for a sample containing whole cells (U.S. Patent No. 7605004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7605004
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile