The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Aug. 30, 2006
Kouichi Tsuji, Osaka, JP;
Takehiko Kitamori, Tokyo, JP;
Manabu Tokeshi, Kanagawa, JP;
Keita Tanaka, Osaka, JP;
Kazuhiko Nakano, Osaka, JP;
Kouichi Tsuji, Osaka, JP;
Takehiko Kitamori, Tokyo, JP;
Manabu Tokeshi, Kanagawa, JP;
Keita Tanaka, Osaka, JP;
Kazuhiko Nakano, Osaka, JP;
Japan Science and Technology Agency, Saitama, JP;
Abstract
A plurality of elements can be analyzed simultaneously with high sensitivity using a microchip. The microchip () comprises a substrate (), a channel () formed in the substrate (), and an analyzing part () consisting of a part of flat surface of the substrate (), where the outlet of the channel () is formed as an opening () and measurement object liquid overflowed from the opening () stays on the flat surface of the substrate () to become a sample of analysis. The measurement object liquid is made to overflow as a sample of analysis to the analyzing part () using the microchip () and then the sample of analysis is preferably dried before a primary X-ray is made to enter under conditions of total reflection and fluorescent X-rays are detected.