The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Jun. 10, 2008
Nobuo Saito, Tokyo, JP;
Yasuhide Takahashi, Tokyo, JP;
Kenichi Takahashi, Tokyo, JP;
Yuuichi Kimura, Tokyo, JP;
Nobuo Saito, Tokyo, JP;
Yasuhide Takahashi, Tokyo, JP;
Kenichi Takahashi, Tokyo, JP;
Yuuichi Kimura, Tokyo, JP;
Right Mfg. Co., Ltd., Tokyo, JP;
Abstract
An instrument for measuring a refractive power includes a target, a target projecting unit, a measurement light projecting unit, a light receiving unit, a unit for performing a normal refractive power measurement, a judgment unit, and a unit for performing a high-speed refractive power measurement. The unit for performing a normal refractive power measurement measures a normal refractive power of an examined eye based on received light data. The judgment unit judges reliability of the received light data or the refractive power measurement. The unit for performing a high-speed refractive power measurement measures a refractive power of the examined eye faster than the unit for performing a normal refractive power measurement in response to a judgment result of the judgment unit.