The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Mar. 26, 2008
Yasufumi Fukuma, Fort Lee, NJ (US);
Hisashi Tsukada, Tokyo, JP;
Tsutomu Kikawa, Tokyo, JP;
Kazuhiko Yumikake, Tokyo, JP;
Yasufumi Fukuma, Fort Lee, NJ (US);
Hisashi Tsukada, Tokyo, JP;
Tsutomu Kikawa, Tokyo, JP;
Kazuhiko Yumikake, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
An optical image measurement device comprises: an interference-light generator configured to generate an interference light by splitting a low-coherence light into a signal light and a reference light and superimposing the signal light having passed through an eye and the reference light having passed through a reference object; a detector configured to detect the generated interference light; a calculator configured to obtain intensity distribution of the interference light in the eye, based on a result of the detection by the detector; a determining part configured to determine a projection position of the signal light to the eye, based on the obtained intensity distribution; and an image forming part configured to form an image of the eye, based on a result of detection of a new interference light based on a new signal light projected toward the determined projection position and a new reference light having passed through the reference object.