The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Jun. 01, 2005
Brian Dravo Davia, Seattle, WA (US);
Curtis Dean Anderson, Kent, WA (US);
Loren James Merriman, Duvall, WA (US);
Patrick Joseph Niemeyer, Seattle, WA (US);
Brian Dravo Davia, Seattle, WA (US);
Curtis Dean Anderson, Kent, WA (US);
Loren James Merriman, Duvall, WA (US);
Patrick Joseph Niemeyer, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A system and method for testing modified code paths without testing unmodified code paths is described. During testing of the baseline build of a program, code coverage data is generated. The code coverage data identifies which test implicates which code path of the baseline build. When a modification of the baseline build is made, the modified build may be differentiated to determine what code of the modified build was changed. When the modified build is differentiated, the code coverage data for the modified code path is mapped to appropriate tests. The tests may then be used to test the changed code path without requiring testing of all the code paths of the modified build.