The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Nov. 17, 2004
Sowmya Subramanian, Mountain View, CA (US);
Larry Dean Harris, Belmont, CA (US);
Sandeep Khemani, Fremont, CA (US);
Thomas W. Nickerson, Independence, CA (US);
George A. Buzsaki, Fremont, CA (US);
Michael DE Groot, Cupertino, CA (US);
Sowmya Subramanian, Mountain View, CA (US);
Larry Dean Harris, Belmont, CA (US);
Sandeep Khemani, Fremont, CA (US);
Thomas W. Nickerson, Independence, CA (US);
George A. Buzsaki, Fremont, CA (US);
Michael De Groot, Cupertino, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Methods and apparatus for enabling efficient testing of application programming interface (API) frameworks and application code are disclosed. According to one aspect of the present invention, a framework suitable for use to test an API includes a metadata provider arrangement that stores declarative metadata and a metadata provider interface that obtains the declarative metadata associated with a test from the declarative metadata provider. A first test adapter includes logic used to process the declarative metadata, and a diagnostic test interface cooperates with the first test adapter to execute the test. The first test adapter is effectively interfaced with the diagnostic test interface. Finally, a diagnostics execution engine is arranged to communicate with the diagnostic test interface to cause the test to be executed.