The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Feb. 16, 2006
Cristian P. Masgras, Round Rock, TX (US);
Michael Pyska, Phoenix, AZ (US);
Edward Brian Boles, Mesa, AZ (US);
Joseph W. Triece, Phoenix, AZ (US);
Igor Wojewoda, Tempe, AZ (US);
Mei-ling Chen, Chandler, AZ (US);
Cristian P. Masgras, Round Rock, TX (US);
Michael Pyska, Phoenix, AZ (US);
Edward Brian Boles, Mesa, AZ (US);
Joseph W. Triece, Phoenix, AZ (US);
Igor Wojewoda, Tempe, AZ (US);
Mei-Ling Chen, Chandler, AZ (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
A special mode key match comparison module has N-storage elements and a special mode key match comparator. The N-storage elements accumulate a serial data stream, and then determine whether a digital device should operate in a normal user mode, in a public programming mode, or in a particular private test mode. To reduce the possibility of accidentally decoding a false test or programming mode, the data stream has a sufficiently large number of N-bits to substantially reduce the probability of a false decode. To further reduce the possibility of accidentally decoding a programming or test mode, the special mode key match comparison module may be reset if less or more than N-clocks are detected during the accumulation of the N-bit serial data stream. The special mode key match data patterns may represent a normal user mode, a public programming mode, and particular private manufacturer test modes.