The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Jun. 20, 2007
Applicants:
Nicholas J. Heaton, Den Haag, NL;
Jack A. LA Vigne, Houston, TX (US);
Ralf Heidler, Houston, TX (US);
Henry N. Bachman, Missouri City, TX (US);
Inventors:
Nicholas J. Heaton, Den Haag, NL;
Jack A. La Vigne, Houston, TX (US);
Ralf Heidler, Houston, TX (US);
Henry N. Bachman, Missouri City, TX (US);
Assignee:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method to determine formation properties using two or more data sets in which the solutions corresponding to the data sets represent shared and distinct formation properties. The method analyzes the data sets and computes distributions for the shared and distinct formation properties from which the formation properties are determined.