The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Oct. 29, 2004
Applicants:

John C. Mcneirney, Fairburn, GA (US);

Peter Solender, Williamsville, NY (US);

Haibo Wang, North Tonawanda, NY (US);

Inventors:

John C. McNeirney, Fairburn, GA (US);

Peter Solender, Williamsville, NY (US);

Haibo Wang, North Tonawanda, NY (US);

Assignee:

Minrad Inc., Orchard Park, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A targeting system, which provides an adjustable optical assembly, for use with imaging systems having a penetrating beam source, a penetrating beam receiver. The optical assembly has a targeting marker in the path of a penetrating beam emitted by the source. The targeting marker is at least partially opaque to the penetrating beam emitted by the source, and the targeting marker indicates a targeting point on a target axis. The optical assembly further includes a sensible targeting beam device that is capable of providing a sensible targeting beam coaxial and collinear with the target axis. In addition, there is provide a method of aligning the targeting system, such as the system described above, and a method of targeting an area of interest. One advantage of the system and method is that it requires only a two point alignment.


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