The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Sep. 03, 2004
Adrian Nachman, Toronto, CA;
Michael L. G. Joy, Toronto, CA;
Karshi F. Hasanov, Toronto, CA;
Richard S. Yoon, Toronto, CA;
Adrian Nachman, Toronto, CA;
Michael L. G. Joy, Toronto, CA;
Karshi F. Hasanov, Toronto, CA;
Richard S. Yoon, Toronto, CA;
Other;
Abstract
A method for non-invasive mapping (imaging) of the electrical impedance of an object. The present invention provides a method, current density impedance imaging (CDII) which produces an impedance image of object by measuring current density distributions and directly calculating the local impedance values. The method includes making measurements of at least two current density vector fields, Jand J, within a region of interest in an object and then calculating the logarithmic gradient of local conductivity, ∇ ln σ(x,y,z), using a formula where {right arrow over (J)}(x,y,z) and {right arrow over (J)}(x,y,z), are the pair of measured nonparallel current densities at point (x,y,z) and ∇ denotes the gradient operator.