The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Sep. 14, 2006
Robert X. Gao, Amherst, MA (US);
Ruqiang Yan, Amherst, MA (US);
Robert X. Gao, Amherst, MA (US);
Ruqiang Yan, Amherst, MA (US);
University of Massachusetts, Boston, MA (US);
Abstract
A signal processing technique that decomposes complex, dynamically changing non-stationary signals from machine components such as bearings into different scales by means of a continuous wavelet transform. The envelope signal in each scale is then calculated from the modulus of the wavelet coefficients. Subsequently, Fourier transform is performed repetitively on the envelope of the signal at each scale, resulting in an 'envelope spectrum' of the original signal at the various scales. The final output is a three-dimensional scale-frequency map that indicates the intensity and location of the defect-related frequency lines. The technique is generic in nature, and applicable not only to machine condition monitoring, but also to the health monitoring of a wide range of dynamic systems, including human beings.