The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Mar. 14, 2005
Jiang Hsieh, Brookfield, WI (US);
Paavana Sainath, Oconomowoc, WI (US);
James Watkins Madine, Milwaukee, WI (US);
Charles Hugh Shaughnessy, Milwaukee, WI (US);
Eugene Clifford Williams, Waukesha, WI (US);
Abdelaziz Ikhlef, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Paavana Sainath, Oconomowoc, WI (US);
James Watkins Madine, Milwaukee, WI (US);
Charles Hugh Shaughnessy, Milwaukee, WI (US);
Eugene Clifford Williams, Waukesha, WI (US);
Abdelaziz Ikhlef, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods and systems for scanning a patient by using a medical imaging device are provided. The methods include determining a defective cell in a row n of a detector of the medical imaging device, determining a mode of operation of the medical imaging device, estimating the output of the defective cell using the determined mode of operation and at least one of a conjugate sample of the defective cell, an adjusted conjugate sample of the defective cell, and an estimate of the output of the defective cell using an output of a corresponding cell in an adjacent row and reconstructing an image of the patient using the estimated value of the defective cell.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile