The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Jul. 29, 2005
Applicants:

Azita Emami-neyestanak, New York, NY (US);

Mounir Meghelli, Tarrytown, NY (US);

Benjamin D. Parker, Peekskill, NY (US);

Sergey V. Rylov, White Plains, NY (US);

Alexander V. Rylyakov, Mount Kisco, NY (US);

Jose A. Tierno, Stamford, CT (US);

Inventors:

Azita Emami-Neyestanak, New York, NY (US);

Mounir Meghelli, Tarrytown, NY (US);

Benjamin D. Parker, Peekskill, NY (US);

Sergey V. Rylov, White Plains, NY (US);

Alexander V. Rylyakov, Mount Kisco, NY (US);

Jose A. Tierno, Stamford, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Clock synchronization and data recovery techniques are disclosed. For example, a technique for synchronizing a clock for use in recovering received data comprises the following steps/operations. A first clock (e.g., a data clock) is set for a first sampling cycle to a first phase position within a given unit interval in the received data. A second clock (e.g., a sweep clock) is swept through other phase positions with respect to the first phase position such that a transition from the given unit interval to another unit interval in the received data is determined. A sampling point is determined based on measurements at the phase positions associated with the second clock. The second clock is set to the phase position corresponding to the sampling point such that data may be recovered at that sampling point. Further, for a next sampling cycle, the first clock may be used to sweep through phase positions with respect to the set phase position of the second clock corresponding to the sampling point in the first sampling cycle such that a next sampling point may be determined.


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