The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Aug. 24, 2005
Koji Kuruma, Kanagawa, JP;
Hirohiko Tsuzuki, Kanagawa, JP;
Koji Kuruma, Kanagawa, JP;
Hirohiko Tsuzuki, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object to be solved by the present invention is to determine the dissociation constant of an analyte molecule immobilized on a metal surface and a molecule that interacts therewith in surface plasmon resonance (SPR) analysis via an analytical method that produces a low noise level (i.e., a noise width of a reference chip), small baseline fluctuations (i.e., signal changes of a reference chip), and highly reliable results of measurement. The present invention provides a method for determining a dissociation constant of an analyte molecule immobilized on a metal surface and a molecule that interacts therewith, wherein changes in surface plasmon resonance signals are measured by using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film; wherein a change in surface plasmon resonance signals is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged; and wherein the dissociation constant is determined based on the results of measurement of signal changes.