The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Jun. 12, 2006
Ricardo Claps, San Jose, CA (US);
Bradley A. Smith, San Jose, CA (US);
Ricardo Claps, San Jose, CA (US);
Bradley A. Smith, San Jose, CA (US);
Neptec Optical Solutions, Inc., Fremont, CA (US);
Abstract
A new architecture for implementing a time-resolved Raman spectrometer is 2-3 orders of magnitude faster than current systems. The system additionally is compact, environmentally rugged, low cost and can detect multiple components of a sample simultaneously. In one embodiment, the invention employs a rotating optical switch to time multiplex an input signal through multiple bandpass filters and into a single optical detector which is electrically activated only when the filtered input light pulse is about to impact it. The combination of time-multiplexing the input signal through multiple optical filters and time-sequencing the optical detector enables the device to detect and analyze 2-3 orders of magnitude faster than current designs, processing spectra within milliseconds instead of seconds. The system can process multiple material samples (25+) simultaneously, instead of sequentially, and its mechanical ruggedness and simplicity enables using the system in harsh physical environments when traditional spectrometers can not be used reliably.