The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Jun. 13, 2008
Applicants:

Chul J. Lee, Lexington, MA (US);

Brian J. Harkins, Westford, MA (US);

Andrew P. Simmons, Andover, MA (US);

Inventors:

Chul J. Lee, Lexington, MA (US);

Brian J. Harkins, Westford, MA (US);

Andrew P. Simmons, Andover, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 13/00 (2006.01); G06T 15/30 (2006.01); G06T 17/20 (2006.01); G06T 15/40 (2006.01); H03F 1/26 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one example, a method to reduce scattering centers (SC) includes receiving a set of SC data points associated with an object in three-dimensional space, partitioning the SC data points into a plurality of volumes, aggregating the SC data points within each volume based on an aggregate threshold and combining the aggregated SC data points associated with each volume to form a reduced set of SC data points. The method also includes comparing the reduced set of SC data points with the received set of SC data points to determine if the reduced set of SC data points meets a set of comparison metrics and if the reduced set of SC data points meets the set of comparison metrics, increasing the size of the volumes and performing another iteration of reducing the SC data points by volume.


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