The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Apr. 11, 2003
Applicants:
Hamed Sari-sarraf, Lubbock, TX (US);
Eric Hequet, Lubbock, TX (US);
Christopher N. Turner, Lubbock, TX (US);
Aijun Zhu, Boston, MA (US);
Inventors:
Hamed Sari-Sarraf, Lubbock, TX (US);
Eric Hequet, Lubbock, TX (US);
Christopher N. Turner, Lubbock, TX (US);
Aijun Zhu, Boston, MA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Fabric wrinkles are automatically evaluated using a reliable, accurate, affordable, and efficient system. Two algorithms are used, the facet model algorithm and the plane-cutting algorithm, to extract features for evaluating wrinkles in fabrics. These algorithms eliminate the need for independent evaluation of a fabric specimen by a technician.