The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Sep. 25, 2007
Tobias Kischkat, Niedersachsen, DE;
Stefen Sroka, Niedersachsen, DE;
Peter Schaefer, GroB Kreutz, DE;
Tobias Kischkat, Niedersachsen, DE;
Stefen Sroka, Niedersachsen, DE;
Peter Schaefer, GroB Kreutz, DE;
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method for measuring optical properties of a fluid downhole, the method comprising measuring intensity of light interacting with the fluid downhole for each of one or more wavelengths; integrating each intensity of light for each wavelength for an integration time; and estimating the optical property from a difference between a starting value and an ending value for the integral of the intensity of light over time divided by the integration time for the wavelength. An apparatus is disclosed for measuring an optical property of a fluid downhole, the apparatus comprising one or more photodiodes that measure an intensity of light interacting with the fluid downhole for each of one or more wavelengths; and one or more integration circuits that each integrates an intensity of light for one wavelength for an integration time.