The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Jun. 25, 2004
Applicants:

Jason Ronald Jenny, Wake Forest, NC (US);

David Phillip Malta, Raleigh, NC (US);

Hudson Mcdonald Hobgood, Pittsboro, NC (US);

Stephan Georg Mueller, Durham, NC (US);

Mark Brady, Carrboro, NC (US);

Robert Tyler Leonard, Raleigh, NC (US);

Adrian Powell, Apex, NC (US);

Valerl F. Tsvetkov, Durham, NC (US);

Inventors:

Jason Ronald Jenny, Wake Forest, NC (US);

David Phillip Malta, Raleigh, NC (US);

Hudson McDonald Hobgood, Pittsboro, NC (US);

Stephan Georg Mueller, Durham, NC (US);

Mark Brady, Carrboro, NC (US);

Robert Tyler Leonard, Raleigh, NC (US);

Adrian Powell, Apex, NC (US);

Valerl F. Tsvetkov, Durham, NC (US);

Assignee:

Cree, Inc., Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 19/00 (2006.01); H01L 31/0312 (2006.01);
U.S. Cl.
CPC ...
Abstract

A single polytype single crystal silicon carbide wafer is disclosed having a diameter greater than three inches and less than five inches, resistivity greater than 10,000 ohm-cm, a micropipe density less than 200 cm, and a combined concentration of shallow level dopants less than 5E16 cm.


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