The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2009

Filed:

Nov. 29, 2005
Applicants:

Simon J. Forrest, Dundee, GB;

Jon Timmis, York, GB;

Rogerio DE Lemos, Canterbury, GB;

Modupe Ayara, Chafford Hundred, GB;

Inventors:

Simon J. Forrest, Dundee, GB;

Jon Timmis, York, GB;

Rogerio de Lemos, Canterbury, GB;

Modupe Ayara, Chafford Hundred, GB;

Assignee:

NCR Corporation, Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06Q 40/00 (2006.01); G07D 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.


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