The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Nov. 16, 2004
Masayuki Hirose, Tokyo, JP;
Masashi Kameyama, Osaka, JP;
Nobuki Dohi, Osaka, JP;
Mitsuo Okumura, Tokyo, JP;
Hong Zhang, Tokyo, JP;
Masayuki Hirose, Tokyo, JP;
Masashi Kameyama, Osaka, JP;
Nobuki Dohi, Osaka, JP;
Mitsuo Okumura, Tokyo, JP;
Hong Zhang, Tokyo, JP;
H&B System Co., Ltd., Tokyo, JP;
The Kansai Electric Power Co., Inc., Osaka, JP;
Kozo Keikaku Engineering Inc., Tokyo, JP;
Abstract
A flaw Z with a long probing length inside a probing target is allowed to be probed. The waves other than the probing target waves are removed or reduced, so that the individual difference in the sizing result due to the ability of the measuring personnel is eliminated to improve the precision of the probing. A transmission probeand a receiving probefor transmitting and receiving a wide band ultrasonic wave are included. Each time the positions of the probesandare moved, a received wave G(t) is obtained. From a spectrum F(f) corresponding to the received wave G(t), a narrowband spectrum FA(f) is extracted. A component wave GA(t) corresponding to the narrow band spectrum FA(f) is obtained by inverse Fourier transformation. The component wave GA(t) is provided for a comparative display using a predetermined sizing coefficient. The position of a flaw Z is determined inside a probing targetright below the line segment connecting the centers of the transmission probeand the receiving probe, based on at which of the measurement points a wave is generated on the comparative display screen.