The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2009

Filed:

Jun. 18, 2004
Applicants:

Eva M. Sevick-muraca, Edinburg, TX (US);

Alan B. Thompson, Hillsboro, OR (US);

Roy Ranadhir, Edinburg, TX (US);

Inventors:

Eva M. Sevick-Muraca, Edinburg, TX (US);

Alan B. Thompson, Hillsboro, OR (US);

Roy Ranadhir, Edinburg, TX (US);

Assignee:

The Texas A&M University System, College Station, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment of the invention, a method for biomedical imaging includes directing time-varying excitation light at a surface area of a light scattering material, the material comprising a fluorescent target. Time-varying emission light from the fluorescent target is detected, substantially at a two-dimensional sensor surface, in response to the time-varying excitation light stimulating the fluorescent target. The time-varying emission light is filtered to reject excitation light re-emitted from the material. A three-dimensional image of the fluorescent target is generated based on the detection substantially at the sensor surface.


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Sevick-Muraca, Eva. (2009). Method and system for near-infrared fluorescence contrast-enhanced imaging with area illumination and area detection (U.S. Patent No. 7599732). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7599732

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