The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Aug. 15, 2006
Koichi Watanabe, Hachioji, JP;
Hiroyuki Minemura, Kokubunji, JP;
Mitsunori Kobayashi, Chigasaki, JP;
Kazuhiro Oda, Yokohama, JP;
Koichi Watanabe, Hachioji, JP;
Hiroyuki Minemura, Kokubunji, JP;
Mitsunori Kobayashi, Chigasaki, JP;
Kazuhiro Oda, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi-LG Data Storage, Inc, Tokyo, JP;
Abstract
An objective of the present invention is to enhance reliability of recorded data by preventing deterioration of OPC (Optimum Power Calibration) accuracy due to an influence of inter-layer interference in an optical disk device capable of writing in a multilayer optical disk. Aiming at the objective, a relationship between asymmetry and a signal modulation depth, which are measured by use of a standard driver is referred, and thereby an offset caused by a device, a disk, a writing state of another layer and the like is compensated. Thus, OPC is executed.