The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Feb. 26, 2007
Applicants:
Yasuhiro Tanibata, Musashino, JP;
Kenji Hachiya, Musashino, JP;
Inventors:
Yasuhiro Tanibata, Musashino, JP;
Kenji Hachiya, Musashino, JP;
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for adjusting a confocal microscope which includes a microscope unit and a confocal scanner unit of Nipkow disk type, emits a light beam for image measurement on a sample, images a returned fluorescent light of the light beam by a CCD (charge-coupled device) digital camera as a confocal image, and enables observation of the sample by the confocal image, the method includes matching a phase of rotation of the Nipkow disk with a phase of an exposure time of the CCD digital camera.