The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
May. 25, 2005
Peter Lehmann, Göttingen, DE;
Peter Lehmann, Göttingen, DE;
Carl Mahr Holding GmbH, Gottingen, DE;
Abstract
A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer () relative to the object surface () generates a measuring signal on a photo receiver, e.g., camera circuit (), from which two extremely closely positioned signal frequencies (f) and (f+Δf) are extracted. The phase difference between the two signal components is used for determining the distance and/or the change in distance. The method has a large unambiguousness range, making it possible to have a large depth measurement range, and can be used for workpieces having offset areas on the surface, wherein the measurement is not disturbed along the edges and the offset areas. The method also allows examining strongly inclined surfaces having a steep inclination such that that traditional methods based on evaluating interference lines cannot be used because of a high density of the interference lines.