The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Aug. 18, 2008
Jon A. Hoshizaki, Cupertino, CA (US);
Howard G. King, Berkeley, CA (US);
Johannes P. Sluis, Redwood City, CA (US);
Steven J. Boege, San Mateo, CA (US);
Mark F. Oldham, Los Gatos, CA (US);
Jon A. Hoshizaki, Cupertino, CA (US);
Howard G. King, Berkeley, CA (US);
Johannes P. Sluis, Redwood City, CA (US);
Steven J. Boege, San Mateo, CA (US);
Mark F. Oldham, Los Gatos, CA (US);
Applied Biosystems, LLC, Carlsbad, CA (US);
Abstract
An optical system includes a sample substrate having a surface, the surface defining a 2-dimensional sample plane. The system includes an excitation source configured to provide excitation light to the sample substrate. The system further includes an optical detector configured to receive emission light from the sample substrate and generate detection data. The system also includes a scan head configured at least (i) to direct the excitation light towards the sample substrate, (ii) to receive emission light from the sample substrate and direct the emission light towards the optical detector, and (iii) for scanning relative to the sample substrate. The system includes at least one actuator configured to scan the scan head relative to the sample substrate, the at least one actuator being configured to provide at least one of (1) a relative linear motion and a relative angular motion about a rotational axis generally perpendicular to the sample plane and (2) two relative angular motions about two respectively different rotational axes generally perpendicular to the sample plane.