The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2009

Filed:

Oct. 18, 2007
Applicants:

Lufan Zou, Ottawa, CA;

Omur M. Sezerman, Kanata, CA;

Inventors:

Lufan Zou, Ottawa, CA;

Omur M. Sezerman, Kanata, CA;

Assignee:

Oz Optics Ltd., Nepean, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for simultaneously measuring strain and temperature characteristics of an object involves the attachment to the object of a pair of optical fibers having different refractive indices, the fibers being connected together at least one end thereof, and directing laser light into at least one end of the fibers. The Brillouin frequency of each of the fibers is measure and the strain and temperature characteristics are calculated based on the coefficients of strain and temperature and the measured Brillouin frequencies of the fibers.


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