The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Jun. 08, 2006
Boon Yong Ang, Santa Clara, CA (US);
Sunhom Paak, San Jose, CA (US);
Hsung Jai Im, Cupertino, CA (US);
Kwansuhk OH, San Jose, CA (US);
Raymond C. Pang, San Jose, CA (US);
Boon Yong Ang, Santa Clara, CA (US);
Sunhom Paak, San Jose, CA (US);
Hsung Jai Im, Cupertino, CA (US);
Kwansuhk Oh, San Jose, CA (US);
Raymond C. Pang, San Jose, CA (US);
XILINX, Inc., San Jose, CA (US);
Abstract
An integrated circuit with an efuse having an efuse link includes a damage detection structure disposed in relation to the efuse so as to detect damage in the IC resulting from programming the efuse. Damage sensing circuitry is optionally included on the IC. Embodiments are used in evaluation wafers to determine proper efuse fabrication and programming parameters, and in production ICs to identify efuse programming damage that might create a latent defect.