The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Feb. 14, 2006
Jay Gaillard, Clemson, SC (US);
Razvan Marian Ciocan, Central, SC (US);
Malcolm Skove, Central, SC (US);
Apparao M. Rao, Anderson, SC (US);
Jay Gaillard, Clemson, SC (US);
Razvan Marian Ciocan, Central, SC (US);
Malcolm Skove, Central, SC (US);
Apparao M. Rao, Anderson, SC (US);
Abstract
A method and system is disclosed that can be used to directly detect and analyze an electric signal electrostatically induced a semi-conductive or conductive element at resonance. Through detection of the changes in the characteristics of the signal from the element, the disclosed devices can detect, for instance, presence of chemical/biological species in a sample or measure physical parameters of a sample such as pressure/acceleration, magnetic force, temperature, and/or extremely small masses. The disclosed systems include one or more micro- or nano-sized elements. Through modulation of an electric charge on a counter-electrode that is located at a pre-determined distance from the element, a modulating charge can be induced upon the element. Resonance can be directly detected via electronic monitoring of the induced signal for the higher harmonics of the natural resonant frequency.