The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Dec. 26, 2007
Daisuke Nishiwaki, Hino, JP;
Ikutoshi Fukushima, Fuchu, JP;
Naobumi Okada, Asaka, JP;
Olympus Corporation, Tokyo, JP;
Abstract
In a confocal laser scanning microscope that is equipped with a first scanning optical system for emitting an observation beam to scan and observe a sample and a second scanning optical system for emitting an excitation beam to scan and stimulate optically a part of the sample, the improvement of providing a micromirror device that simultaneously reflects the observation beam and the excitation beam as multiple sub-beams onto the sample. An optical scanning method using a confocal laser scanning microscope is disclosed that scans a sample with an observation beam and an excitation beam simultaneously using multiple observation beam spots and multiple excitation beams spots, thereby enabling events of short duration to be observed and/or recorded.