The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Jan. 30, 2007
Robert Shock, Meriden, CT (US);
Edward Desplaines, Cheshire, CT (US);
Cliff Perdion, Cheshire, CT (US);
William Bertuleit, Berlin, CT (US);
Joe Camardo, Newington, CT (US);
Mike Cotteleer, West Chicago, IL (US);
James Gruenbacher, Meriden, CT (US);
Richard Jacaruso, Baton Rouge, LA (US);
Terry Paradis, Bristol, CT (US);
Steve Weiss, Naugatuck, CT (US);
Robert Shock, Meriden, CT (US);
Edward DesPlaines, Cheshire, CT (US);
Cliff Perdion, Cheshire, CT (US);
William Bertuleit, Berlin, CT (US);
Joe Camardo, Newington, CT (US);
Mike Cotteleer, West Chicago, IL (US);
James Gruenbacher, Meriden, CT (US);
Richard Jacaruso, Baton Rouge, LA (US);
Terry Paradis, Bristol, CT (US);
Steve Weiss, Naugatuck, CT (US);
Airgas, Inc., Cheshire, CT (US);
Abstract
A system for certifying a concentration of gas in a cylinder includes a gas cell configured to receive a sample gas from a cylinder, and an FTIR module coupled to the gas cell for scanning the sample gas and forming a beam spectrum. A processor is coupled to the FTIR module for calculating an intensity response of the sample gas based on the beam spectrum. A storage device is included for storing data points of a plot of intensity response of a known gas versus concentration levels. The processor is configured to interpolate between the stored data points of the plot to determine an interpolated data point corresponding to the intensity response of the sample gas. The processor provides to the user a concentration level of the sample gas, based on the interpolated data point.