The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Jun. 15, 2006
System and method for using a spray/liquid particle count (lpc) to measure particulate contamination
Yi Zhao Yao, Singapore, SG;
Hui Yan HU, Singapore, SG;
Shaoyong Liu, Singapore, SG;
Kelvin Ang Kor Seng, Singapore, SG;
Garvin J. Stone, San Juan Bautista, CA (US);
Gina M. Whitney, San Jose, CA (US);
Yi Zhao Yao, Singapore, SG;
Hui Yan Hu, Singapore, SG;
Shaoyong Liu, Singapore, SG;
Kelvin Ang Kor Seng, Singapore, SG;
Garvin J. Stone, San Juan Bautista, CA (US);
Gina M. Whitney, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A system and method for using a spray/liquid particle count (LPC) to measure particulate contamination is disclosed. Initially, a component for particulate extraction is received. A sprayer is provided for spraying a liquid on the component. In addition, a container is provided for catching the liquid spraying on the component. The container is clean prior to receiving the liquid and the liquid is collected for later analysis of a number of particles extracted from the component.