The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Nov. 17, 2004
Applicants:

Stephen A. Chessin, Mountain View, CA (US);

Tarik P. Soydan, Acton, MA (US);

Louis Y. Tsien, Watertown, MA (US);

Inventors:

Stephen A. Chessin, Mountain View, CA (US);

Tarik P. Soydan, Acton, MA (US);

Louis Y. Tsien, Watertown, MA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention provides a system that determines the cause of a correctable memory error. First, the system detects a correctable error during an access to a memory location in a main memory by a first processor, wherein the correctable error is detected by error detection and correction circuitry. Next, the system reads tag bits for a cache line associated with the memory location, wherein the tag bits contain address information for the cache line, as well as state information indicating a coherency protocol state for the cache line. The system then tests the memory location by causing the first processor to perform read and write operations to the memory location to produce test results. Finally, the system uses the test results and the tag bits to determine the cause of the correctable error, if possible.


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