The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Jan. 30, 2006
Applicants:

Ti-chiun Chang, Plainsboro, NJ (US);

Jason Jenn-kwei Tyan, Princeton, NJ (US);

Inventors:

Ti-chiun Chang, Plainsboro, NJ (US);

Jason Jenn-Kwei Tyan, Princeton, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/64 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for estimating feature values from a digitized image includes calculating a gradient of an image, defining a filter weighting function, convolving the gradient with the filter weighting function, integrating over a subdomain of the convolved gradient to calculate components of a cost matrix Φ, wherein the cost matrix minimizes a distance metric in a frequency domain of the image, solving for the eigenvalues of the cost matrix, and calculating one or more features from the cost matrix eigenvalues. One or more predesigned bandpass filters can be applied to the image, and cost matrix eigenvalues are analyzed to select one or more appropriate bandpass filters to be applied to the image.


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