The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Jun. 21, 2004
Applicant:

Hans-peter Diehl, Constance, DE;

Inventor:

Hans-Peter Diehl, Constance, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is described a method and an arrangement for the metrological detection of the differences in the visually perceived color impression between a multi-color patterned surface () of a reference and a multi-color patterned surface () of a test item. Concomitantly changes in the color statistics and in other color variation rates of the test item compared to a reference, and changes in the picture definition of the pattern of the test item compared to the reference, are determined by means of spatial sensors () provided with color capability, such as color picture cameras and displayed. According to the invention, a common variation rate for the visually perceived color variation of multi-color patterned surfaces with references is established by a combination of the two variations.


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