The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Nov. 19, 2002
Nicola Dioguardi, Rozzano, IT;
Fabio Grizzi, Rozzano, IT;
Carlo Russo, Rozzano, IT;
Barbara Franceschini, Rozzano, IT;
Nicola Dioguardi, Rozzano, IT;
Fabio Grizzi, Rozzano, IT;
Carlo Russo, Rozzano, IT;
Barbara Franceschini, Rozzano, IT;
Humanitas Mirasole S.P.S., Milan, IT;
Abstract
The present invention relates to a method and an apparatus for processing images of irregularly shaped objects, such as biological specimens, in particular of human or animal origin, or images thereof. The metric quantification of a biological body part or tissue or of an abnormal material spot or aggregate contained therein is also performed by means of the invention method. In particular, the present invention relates to a method for processing images of irregularly shaped objects, comprising a stage of acquisition of a digital image of said object, a stage of image elaboration (IMAEL) for quantifying said digital image to 1 bit and a stage of metrical processing of said 1-bit quantized image, wherein said stage of metrical processing comprises: —) a stage of object's metrical quantification (QUANT) for determining Euclidean perimeter P and/or area A of said object; —) a stage of dimensional calculation (DIM-CLC) for calculating a fractal-corrected perimeter Pf and/or area Af of said object.