The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Jun. 02, 2006
Qingying HU, Clifton Park, NY (US);
Magdi Naim Azer, Niskayuna, NY (US);
Kevin George Harding, Niskayuna, NY (US);
John Broddus Deaton, Jr., Niskayuna, NY (US);
Sudhir Kumar Tewari, West Chester, OH (US);
Qingying Hu, Clifton Park, NY (US);
Magdi Naim Azer, Niskayuna, NY (US);
Kevin George Harding, Niskayuna, NY (US);
John Broddus Deaton, Jr., Niskayuna, NY (US);
Sudhir Kumar Tewari, West Chester, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The profilometry apparatus also includes a signal processing unit configured to process the captured image from the optical unit to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object.