The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Jun. 23, 2006
Takaaki Hirata, Tokyo, JP;
Minoru Maeda, Tokyo, JP;
Hironori Takai, Tokyo, JP;
Hiroki Saitou, Tokyo, JP;
Takaaki Hirata, Tokyo, JP;
Minoru Maeda, Tokyo, JP;
Hironori Takai, Tokyo, JP;
Hiroki Saitou, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A wavelength monitor includes the following elements. An optical divider divides a beam of measured light into first and second divided beams of measured light. An interfering element converts the first and second divided beams of measured light into first and second parallel beams of measured light to cause interference between the first and second parallel beams of measured light with each other thereby generating an interfered beam of measured light. A light receiving element way including a plurality of light receiving elements receives the interfered beam of measured light. An interference signal converting unit receives output signals from the light receiving element array to generate interference signals different in phase by 90 degrees from each other. A signal processing unit receives the interference signals from the interference signal converting unit to obtain a wavelength of the measured light from the interference signals.