The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2009
Filed:
Oct. 15, 2007
Arthur H. Hartog, Winchester, GB;
Peter C. Wait, Salisbury, GB;
Arthur H. Hartog, Winchester, GB;
Peter C. Wait, Salisbury, GB;
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
An optical time domain reflectometry apparatus for sensing a parameter in a region of interest is characterized in that the optical fiber includes a first section into which optical radiation at the probe wavelength is launched and a second section deployed in the region of interest. The first section has a higher intensity threshold for the onset of non-linear effects than the second section. The source launches the optical radiation into the first section at an intensity lower than the non-linear effects intensity threshold of the first section but higher than the non-linear effects intensity threshold of the second section. The attenuation characteristics of the first section are chosen such that the intensity of the optical radiation at the probe wavelength that reaches the second section is below the threshold for the onset of non-linear effects of the second section.