The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Apr. 30, 2002
Applicants:

Angela Rieger, Munich, DE;

Kurt Lainer, Kirchheim bei Munich, DE;

Bernhard Reifert, Muehldorf, DE;

Valentin Illich, Munich, DE;

Sebastian Thoma, Rosenheim, DE;

Inventors:

Angela Rieger, Munich, DE;

Kurt Lainer, Kirchheim bei Munich, DE;

Bernhard Reifert, Muehldorf, DE;

Valentin Illich, Munich, DE;

Sebastian Thoma, Rosenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/033 (2006.01); G06F 3/00 (2006.01); G01R 19/00 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A value editor and a corresponding method is described for a measuring apparatus, by which setting parameter values can be modified. Parameters can be set for at one of multiple functional units and modified by control elements. Multiple control elements can together constitute a control block and the active control block is highlighted by a focus. To modify parameter values in the highlighted focus, displayed alphanumerically in the control elements, a first or second edit mode can be selected.


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