The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

May. 09, 2008
Applicant:

Yu-hsuan Tu, Tainan, TW;

Inventor:

Yu-Hsuan Tu, Tainan, TW;

Assignee:

Mediatek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method of gain error calibration in a pipelined analog-to-digital converter (ADC). In one embodiment, a first stage and a second stage of the pipelined ADC share a common operational amplifier. The first stage is requested to generate the stage output signal thereof according to a first correction number. The second stage is also requested to generate the stage output signal thereof according to a second correction number. A plurality of stage output values generated by stages of the pipelined ADC are collected. The stage output values are respectively correlated with the first correction number and the second correction number to estimate a first gain error estimate of the first stage and a second gain error estimate of the second stage. The first gain error estimate and the second gain error estimate are weighted to obtain a predicted gain error for gain error calibration in the first stage and the second stage.


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