The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7595493 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 29, 2009

Filed:

Aug. 09, 2005
Applicants:

Satoshi Okada, Kanagawa-ken, JP;

Yoshihiro Ogawa, Tokyo, JP;

Masato Inoue, Saitama-ken, JP;

Kazumi Nagano, Kanagawa-ken, JP;

Shinichi Takeda, Kanagawa-ken, JP;

Tomoyuki Tamura, Kanagawa-ken, JP;

Inventors:

Satoshi Okada, Kanagawa-ken, JP;

Yoshihiro Ogawa, Tokyo, JP;

Masato Inoue, Saitama-ken, JP;

Kazumi Nagano, Kanagawa-ken, JP;

Shinichi Takeda, Kanagawa-ken, JP;

Tomoyuki Tamura, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radiation detecting apparatus includes a sensor panel, a phosphor layerformed on the sensor panelto convert a radiation into light, and a phosphor protecting membercovering the phosphor layerto adhere closely to the phosphor protecting member. The phosphor protecting memberincludes a phosphor protecting layermade of vapor deposition polymerization polyimide formed by vapor deposition polymerization, a reflecting layerreflecting the light converted by the phosphor layer, and a protecting layermade of vapor deposition polymerization polyurea formed by the vapor deposition polymerization. By such a configuration, a polymerization reaction of the phosphor protecting layeris performed on the substrate. Thereby, the generation of by-products is suppressed to make it easy to acquire the uniformity of film quality. Consequently, the generation of a situation in which structural disorders are generated on the reflection surface of the reflecting layerto cause image defects can be suppressed.


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