The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Mar. 09, 2004
Applicants:

Robert J. Svoboda, Swartz Creek, MI (US);

Haskell Simpkins, Grand Blanc, MI (US);

Joseph M. Keller, Grand Blanc, MI (US);

Vincent L. Sprenkle, Richland, WA (US);

Kerry D. Meinhardt, Kennewick, WA (US);

Nathan L. Canfield, Kennewick, WA (US);

Inventors:

Robert J. Svoboda, Swartz Creek, MI (US);

Haskell Simpkins, Grand Blanc, MI (US);

Joseph M. Keller, Grand Blanc, MI (US);

Vincent L. Sprenkle, Richland, WA (US);

Kerry D. Meinhardt, Kennewick, WA (US);

Nathan L. Canfield, Kennewick, WA (US);

Assignees:

Delphi Technologies, Inc., Troy, MI (US);

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, the method of producing a ceramic assembly includes: disposing an electrode precursor on an electrolyte precursor having an electrolyte sintering shrinkage, disposing a stabilizer precursor having a stabilizer sintering shrinkage on the electrode precursor on a side opposite the electrolyte precursor to form a precursor assembly, and sintering the precursor assembly to form the ceramic assembly comprising a stabilizer layer, electrode, and electrolyte. The difference between the electrolyte sintering shrinkage and the stabilizer sintering shrinkage is less than or equal to ±1% and a surface of the ceramic assembly has less than or equal to about 5.0 degrees camber, as measured from the horizontal plane.


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